AT87C52X2-3CSUM【PDF 30/55 页】IC 8051 MCU 8K OTP 40MHZ 40DIP

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TS8xCx2X2

4184I–8051–02/08

Electrical

Characteristics

Absolute Maximum

Ratings(1)

Power Consumption

Measurement

Since the introduction of the first C51 devices, every manufacturer made operating Icc

measurements under reset, which made sense for the designs were the CPU was run-

ning under reset. In Atmel new devices, the CPU is no more active during reset, so the

power consumption is very low but is not really representative of what will happen in the

customer system. That’s why, while keeping measurements under Reset, Atmel pre-

sents a new way to measure the operating Icc:

Using an internal test ROM, the following code is executed:

Label:

SJMP Label (80 FE)

Ports 1, 2, 3 are disconnected, Port 0 is tied to FFh, EA = Vcc, RST = Vss, XTAL2 is not

connected and XTAL1 is driven by the clock.

This is much more representative of the real operating Icc.

DC Parameters for

Standard Voltage

TA = 0°C to +70°C; VSS = 0 V; VCC = 5V ± 10%; F = 0 to 40 MHz.

TA = -40°C to +85°C; VSS = 0 V; VCC = 5V ± 10%; F = 0 to 40 MHz.

Ambiant Temperature Under Bias:

C = commercial......................................................0°C to 70°C

I = industrial ........................................................-40°C to 85°C

Storage Temperature .................................... -65°C to + 150°C

Voltage on VCC to VSS .........................................-0.5V to + 7 V

Voltage on VPP to VSS .......................................-0.5V to + 13 V

Voltage on Any Pin to VSS..........................-0.5V to VCC + 0.5V

Power Dissipation ........................................................... 1 W(2)

Notes: 1.

Stresses at or above those listed under “ Absolute

Maximum Ratings” may cause permanent dam-

age to the device. This is a stress rating only and

functional operation of the device at these or any

other conditions above those indicated in the

operational sections of this specification is not

implied. Exposure to absolute maximum rating

conditions may affect device reliability.

2. This value is based on the maximum allowable die

temperature and the thermal resistance of the

package.

Table 22. DC Parameters in Standard Voltage

Symbol

Parameter

Min

Typ

Max

Unit

Test Conditions

VIL

Input Low Voltage

-0.5

0.2 VCC - 0.1

VIH

Input High Voltage except XTAL1, RST

0.2 VCC + 0.9

VCC + 0.5

VIH1

Input High Voltage, XTAL1, RST

0.7 VCC

VCC + 0.5

VOL

Output Low Voltage, ports 1, 2, 3 (6)

0.3

0.45

1.0

IOL = 100 A(4)

IOL = 1.6 mA(4)

IOL = 3.5 mA(4)

VOL1

Output Low Voltage, port 0 (6)

0.3

0.45

1.0

IOL = 200 A(4)

IOL = 3.2 mA(4)

IOL = 7.0 mA(4)

VOL2

Output Low Voltage, ALE, PSEN

0.3

0.45

1.0

IOL = 100 A(4)

IOL = 1.6 mA(4)

IOL = 3.5 mA(4)

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